IEEE 1149

IEEE 1149

Keywords: Boundary Scan, JTAG,Scan, Bscan, BST

IEEE 1149.x standard contents

1149.1 test for digital assemblies
1149.4 test for mixed signal and analog assemblies
1149.5 test at system level
1149.2 Obsoleted, merged with 1149.1
1149.3 become defunct (Obsolete)
1532derivative standard for in-system programming of digital devices

JTAG Boundary scan basics

IEEE Std 1149.1-1990 and IEEE Std 1149.1a-1993 define the architecture of the Test Access Port (TAP) and shift-registers implemented in boundary-scan devices.

For boundary scan testing, signal pins of compliant semiconductor devices are typically connected to cells in a parallel-in, parallel-out shift register. This shift-register forms a path around the periphery or the boundary of the semiconductor device. The entry and exit points of the shift register are connected to the TDI and TDO pins respectively, thus allowing access to signal pins. By sending proper "test vectors" down the boundary register, and by enabling test vectors onto the device pins, various tests can be performed.

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